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  rej03c0367-0100, rev.1.00, 2009.05.07 page 1 of 16 r1lv3216r series 32mb advanced lpsram (2m word x 16bit / 4m word x 8bit) rej03c0367-0100 rev.1.00 2009.05.07 description the r1lv3216r series is a family of low voltage 32-mbit static rams organized as 2,097,152-word by 16-bit, fabricated by renesas?s high-performance 0.15um cmos and tft technologies. the r1lv3216r series is suitable for memory applications where a simple interfacing, battery operating and battery backup are the important design objectives. the r1lv3216r series is provided in 48-pin thin small outline package [tsop (i): 12mm x 20mm with pin pitch of 0.5mm] and 52-pin micro thin small outline package [ tsop (ii): 10.79mm x 10.49mm with pin pitch of 0.4mm]. it gives the best solution for compaction of mounting area as well as flexibility of wiring pattern of printed circuit boards. features ? single 2.7~3.6v power supply ? small stand-by current: 4 a (3.0v, typical) ? no clocks, no refresh ? all inputs and outputs are ttl compatible. ? easy memory expansion by cs1#, cs2, lb# and ub# ? common data i/o ? three-state outputs: or-tie capability ? oe# prevents data contention on the i/o bus ordering information type no. access time package r1lv3216rsa-5s% 55 ns r1lv3216rsa-7s% 70 ns 12mm x 20mm 48-pin plastic tsop (i) (normal-bend type) (48p3r) r1lv3216rsd-5s% 55 ns r1lv3216rsd-7s% 70 ns 350 mil 52-pin plastic -tsop (ii) (normal-bend type) (52ptg) % - temperature version; see table below % temperature range r 0 ~ +70 c i -40 ~ +85 c
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 2 of 16 pin arrangement 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 52 51 50 49 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 a15 a14 a13 a12 a11 a10 a9 a8 a19 cs1# we# nc nc vcc cs2 nc a20 a18 a17 a7 a6 a5 a4 a3 a2 a1 a 16 byte# ub# vss lb# dq15/a-1 dq7 dq14 dq6 dq13 dq5 dq12 dq4 nc dq11 dq3 dq10 dq2 dq9 dq1 dq8 dq0 oe# vss nc a0 52-pin tsop (ii) 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 a15 a14 a13 a12 a11 a10 a9 a8 a19 a20 we# cs2 nc ub# lb# a18 a17 a7 a6 a5 a4 a3 a2 a1 a 16 byte# vss dq15/a-1 dq7 dq14 dq6 dq13 dq5 dq12 dq4 vcc dq11 dq3 dq10 dq2 dq9 dq1 dq8 dq0 oe# vss cs1# a0 48-pin tsop (i)
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 3 of 16 pin description pin name function vcc power supply vss ground a0 to a20 address input (word mode) a-1 to a20 address input (byte mode) dq0 to dq15 data input/output cs1# chip select 1 cs2 chip select 2 we# write enable oe# output enable lb# lower byte enable ub# upper byte enable byte# byte control mode enable nc non connection
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 4 of 16 block diagram a 0 cs1# a 1 cs2 lb# ub# we# oe# a 20 byte# dq0 dq1 dq7 dq8 dq9 dq15 / a -1 vcc vss column decoder x 8 / x16 control dq buffer address buffer row decoder memory array 2m-word x16-bit or 4m-word x 8-bit dq buffer dat a selector sense / write amplifier clock generator
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 5 of 16 operation table cs1# cs2 byte# lb# ub# we# oe# dq0~7 dq8~14 dq15 operation h x x x x x x high-z high-z high-z stand-by x l x x x x x high-z high-z high-z stand-by x x h h h x x high-z high-z high-z stand-by l h h l h l x din high-z high-z write in lower byte l h h l h h l dout high-z high-z read in lower byte l h h l h h h high-z high-z high-z output disable l h h h l l x high-z din din write in upper byte l h h h l h l high-z dout dout read in upper byte l h h h l h h high-z high-z high-z output disable l h h l l l x din din din word write l h h l l h l dout dout dout word read l h h l l h h high-z high-z high-z output disable l h l l l l x din high-z a-1 byte write l h l l l h l dout high-z a-1 byte read l h l l l h h high-z high-z a-1 output disable note 1. h: v ih l:v il x: v ih or v il 2. when apply byte# =?l?, please assign lb#=ub#=?l?. absolute maximum ratings parameter symbol value unit power supply voltage relative to vss vcc -0.5 to +4.6 v terminal voltage on any pin relative to vss v t -0.5 *1 to vcc+0.3 *2 v power dissipation p t 0.7 w r ver. 0 to +70 c operation temperature topr *3 i ver. -40 to +85 c storage temperature range tstg -65 to 150 c r ver. 0 to +70 c storage temperature range under bias tbias *3 i ver. -40 to +85 c note 1. ?2.0v in case of ac (pulse width 30ns) 2. maximum voltage is +4.6v. 3. ambient temperature range depends on r/i-version. please see table on page 1.
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 6 of 16 recommended operati ng conditions parameter symbol min. typ. max. unit note vcc 2.7 3.0 3.6 v supply voltage vss 0 0 0 v input high voltage v ih 2.4 - vcc+0.2 v input low voltage v il -0.2 - 0.4 v 1 r ver. 0 - +70 c 2 ambient temperature range i ver. ta -40 - +85 c 2 note 1. ?2.0v in case of ac (pulse width 30ns) 2. ambient temperature range depends on r/i-version. please see table on page 1. dc characteristics parameter symbol min. typ. max. unit test conditions input leakage current | i li | - - 1 p a vin = vss to vcc output leakage current | i lo | - - 1 p a byte# vcc -0.2v or byte# 0.2v cs1# =v ih or cs2 =v il or oe# =v ih or we# =v il or lb# = ub# =v ih , vi/o =vss to vcc i cc1 - 40 *1 55 ma min. cycle, duty =100%, i i/o = 0ma byte# vcc -0.2v or byte# 0.2v cs1# =v il , cs2 =v ih , others = v ih /v il average operating current i cc2 - 3 *1 8 ma cycle =1 p s, duty =100%, i i/o = 0ma byte# vcc -0.2v or byte# 0.2v cs1# 0.2v, cs2 v cc -0.2v, v ih v cc -0.2v, v il 0.2v standby current i sb - 0.1 *1 0.3 ma byte# vcc -0.2v or byte# 0.2v cs2 =v il - 4 *1 12 p a ~+25c - 7 *2 24 p a ~+40c - - 50 p a ~+70c standby current i sb1 - - 80 p a ~+85c vin 0v byte# vcc -0.2v or byte# 0.2v (1) 0v cs2 0.2v or (2) cs1# v cc -0.2v, cs2 v cc -0.2v or (3) lb# = ub# v cc -0.2v, cs1# 0.2v, cs2 v cc -0.2v output high voltage v oh 2.4 - - v byte# vcc -0.2v or byte# 0.2v i oh = -0.5ma output low voltage v ol - - 0.4 v byte# vcc -0.2v or byte# 0.2v i ol = 2ma note 1. typical parameter indicates the value for the center of distribution at 3.0v (ta= 25oc), and not 100% tested. 2. typical parameter indicates the va lue for the center of di stribution at 3.0v (ta= 40oc), and not 100% tested.
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 7 of 16 capacitance (ta =25c, f =1mhz) parameter symbol min. typ. max. unit test conditions note input capacitance c in - - 10 pf vin =0v 1 input / output capacitance c i/o - - 10 pf v i/o =0v 1 note1.this parameter is sa mpled and not 100% tested. ac characteristics test conditions (vcc = 2.7v ~ 3.6v, ta = 0 ~ +70c / -40 ~ +85c *1 ) ? input pulse levels: v il = 0.4v, v ih = 2.4v ? input rise and fall time: 5ns ? input and output timing reference level: 1.4v ? output load: see figures (including scope and jig) note1. ambient temperature range depends on r/i-version. please see table on page 1. dq 1.4v r l = 500 ohm c l = 30 pf
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 8 of 16 read cycle r1lv3216r**-5s r1lv3216r**-7s parameter symbol min. max. min. max. unit note read cycle time t rc 55 - 70 - ns address access time t aa - 55 - 70 ns t acs1 - 55 - 70 ns chip select access time t acs2 - 55 - 70 ns output enable to output valid t oe - 25 - 35 ns output hold from address change t oh 10 - 10 - ns lb#, ub# access time t ba - 55 - 70 ns t clz1 10 - 10 - ns 2,3 chip select to output in low-z t clz2 10 - 10 - ns 2,3 lb#, ub# enable to low-z t blz 5 - 5 - ns 2,3 output enable to output in low-z t olz 5 - 5 - ns 2,3 t chz1 0 20 0 25 ns 1,2,3 chip deselect to output in high-z t chz2 0 20 0 25 ns 1,2,3 lb#, ub# disable to high-z t bhz 0 20 0 25 ns 1,2,3 output disable to output in high-z t ohz 0 20 0 25 ns 1,2,3
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 9 of 16 write cycle r1lv3216r**-5s r1lv3216r**-7s parameter symbol min. max. min. max. unit note write cycle time t wc 55 - 70 - ns address valid to end of write t aw 50 - 65 - ns chip select to end of write t cw 50 - 65 - ns 5 write pulse width t wp 40 - 55 - ns 4 lb#, ub# valid to end of write t bw 50 - 65 - ns address setup time t as 0 - 0 - ns 6 write recovery time t wr 0 - 0 - ns 7 data to write time overlap t dw 25 - 35 - ns data hold from write time t dh 0 - 0 - ns output enable from end of write t ow 5 - 5 - ns 2 output disable to output in high-z t ohz 0 20 0 25 ns 1,2 write to output in high-z t whz 0 20 0 25 ns 1,2 note1. t chz , t ohz , t whz and t bhz are defined as the time at which the ou tputs achieve the open circuit conditions and are not referred to output voltage levels. 2. this parameter is sampled and not 100% tested. 3. at any given temperature and voltage condition, t hz max is less than t lz min both for a given device and from device to device. 4. a write occurs during the overlap of a low cs1#, a high cs2, a low we# and a low lb# or a low ub#. a write begins at the latest tr ansition among cs1# going low, cs2 going high, we# going low and lb# going low or ub# going low . a write ends at the earliest trans ition among cs1# going high, cs2 going low, we# going high and lb# going high or ub# going high. t wp is measured from the beginning of write to the end of write. 5. t cw is measured from the later of cs1# going low or cs2 going high to end of write. 6. t as is measured the address valid to the beginning of write. 7. t wr is measured from the earliest of cs1# or we# going high or cs2 goi ng low to the end of write cycle.
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 10 of 16 byte# timing conditions r1lv3216r**-5s r1lv3216r**-7s parameter symbol min. max. min. max. unit note byte setup time t bs 5 - 5 - ms byte recove ry time t br 5 - 5 - ms byte# timing waveforms cs2 cs1# byte# t bs t br
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 11 of 16 timing waveforms read cycle *1 note1. byte# vcc ? 0.2v or byte# 0.2v t aa t blz cs2 cs1# oe# a 0~20 a -1~20 lb#,ub# we# dq 0~15 dq 0~7 v ih v il t oh t ba t bhz t clz1 t acs1 t clz2 t acs2 t oe t olz t chz1 t chz2 t ohz valid data high impedance we# = ?h? level (word mode) (byte mode) t rc (word mode) (byte mode)
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 12 of 16 write cycle (1) *1 (we# clock) note1. byte# vcc ? 0.2v or byte# 0.2v cs2 cs1# oe# a 0~20 a -1~20 lb#,ub# we# dq 0~15 dq 0~7 t oh t bw t cw t cw t ow t ohz (word mode) (byte mode) t wc (word mode) (byte mode) t aw t as t wp t wr t dw t dh t whz valid data t olz
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 13 of 16 write cycle (2) *1 (cs1#, cs2 clock) note1. byte# vcc ? 0.2v or byte# 0.2v cs2 cs1# oe# a 0~20 a -1~20 lb#,ub# we# dq 0~15 dq 0~7 v ih v il t bw t cw t cw oe# = ?h? level (word mode) (byte mode) t wc (word mode) (byte mode) t aw valid data t as t wr t wr t dw t dh t as t wp
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 14 of 16 write cycle (3) *1 (lb#, ub# clock) note1. byte# vcc ? 0.2v or byte# 0.2v cs2 cs1# oe# a 0~20 a -1~20 lb#,ub# we# dq 0~15 dq 0~7 v ih v il t bw t cw t cw oe# = ?h? level (word mode) (byte mode) t wc (word mode) (byte mode) valid data t aw t as t wp t wr t dw t dh
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 15 of 16 low vcc data retention characteristics parameter symbol min. typ. max. unit test conditions *3 v cc for data retention v dr 2.0 - 3.6 v vin 0v byte# vcc -0.2v or byte# 0.2v (1) 0v cs2 0.2v or (2) cs1# v cc -0.2v, cs2 v cc -0.2v or (3) lb# = ub# v cc -0.2v, cs1# 0.2v, cs2 v cc -0.2v - 4 *1 12 p a ~+25c - 7 *2 24 p a ~+40c - - 50 p a ~+70c data retention current i ccdr - - 80 p a ~+85c vin 0v byte# vcc -0.2v or byte# 0.2v (1) 0v cs2 0.2v or (2) cs1# v cc -0.2v, cs2 v cc -0.2v or (3) lb# = ub# v cc -0.2v, cs1# 0.2v, cs2 v cc -0.2v chip select to data retention time t cdr 0 - - ns operation recovery time t r 5 - - ms see retention waveform. note 1. typical parameter indicates the value for the center of distribution at 3.0v (ta= 25oc), and not 100% tested. 2. typical parameter indicates the va lue for the center of di stribution at 3.0v (ta= 40oc), and not 100% tested. 3. cs2 also controls address buffer, we# buffer ,c s1# buffer ,oe# buffer ,lb# ,ub# buffer and din buffer. if cs2 controls data retent ion mode, vin levels (address, we# ,oe #,cs1#,lb#,ub#,i/o) c an be in the high impedance state. if cs1# controls dat a retention mode, cs2 must be cs2 vcc-0.2v or0v cs2 0.2v. the other input levels (address, we# ,oe#,cs1#,lb#,ub#,i/o) can be in the high impe dance state.
r1lv3216r series rej03c0367-0100, rev.1.00, 2009.05.07 page 16 of 16 low vcc data retention timing waveforms *1 note1. byte# vcc ? 0.2v or byte# 0.2v cs2 cs1# lb#, ub# vcc vcc vcc (1) cs1# controlled (2) cs2 controlled (3) lb#, ub controlled t cdr t r 2.7v 2.7v 2.2v 2.2v v dr t cdr t r 2.7v 2.7v 2.2v 2.2v v dr t cdr t r 2.7v 2.7v 0.6v 0.6v v dr cs1#
revision history r1lv3216 r series data sheet contents of revision rev. date page description 0.01 mar.24, 2008 - initial issu e: preliminary data sheet 1.00 may 07, 2009 - finalized 5 operation table corrected 6 error corrected: i sb test condition cs2=v ih ->v il
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(note 1) ?renesas electronics? as used in this document means renesas electronics corporation and also includes its majority- owned subsidiaries. (note 2) ?renesas electronics product(s)? means any product developed or manufactured by or for renesas electronics.


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